标准编号：ISO 17867:2015
中文名称：粒度分析 小角度x射线散射
英文名称：Particle size analysis — Small-angle X-ray scattering
发布日期：2015-05
标准范围
Small-angle X-ray scattering (SAXS) is a well-established technique that allows structural informationto be obtained about inhomogeneities in materials with a characteristic length from 1 nm to 100 nm.Under certain conditions (narrow size distributions, appropriate instrumental configuration, andidealised shape) the limit of 100 nm can be significantly extended. This International Standard specifiesa method for the application of SAXS to the estimation of mean particle sizes in dilute dispersionswhere the interaction between the particles is negligible. This International Standard allows twocomplementary data evaluation methods to be performed, model fitting and Guinier approximation.The most appropriate evaluation method shall be selected by the analyst and stated clearly in the report.SAXS is sensitive to electron density fluctuations. Therefore, particles in solution and pores in a matrixcan be studied in same way.
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