标准编号：ISO/TS 10867:2010
中文名称：纳米技术 近红外光致发光谱法表征单壁碳纳米管
英文名称：Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
发布日期：2010-09
标准范围
This Technical Specification provides guidelines for the characterization of single-wall carbon nanotubes(SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.This Technical Specification provides a measurement method for the determination of the chiral indices of thesemi-conducting SWCNT in a sample and their relative integrated PL intensities.The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in asample from measured integrated PL intensities and knowledge of their PL cross-sections.
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