标准编号：ISO 18452:2005
中文名称：精细陶瓷 （高级陶瓷,高技术陶瓷）-用接触式探针表面光度仪测定陶瓷涂层的厚度
英文名称：Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer
发布日期：2005-11
标准范围
This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000nm.NOTEThe method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate.
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