标准编号：ISO/TR 21477:2017
中文名称：光学和光子学 光学元件和系统绘图 表面缺陷规范和测量系统
英文名称：Optics and photonics — Preparation of drawings for optical elements and systems — Surface imperfection specification and measurement systems
发布日期：2017-08
标准范围
This document intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISO 10110-7 and ISO 14997, specifically the dimensional method and the visibility method, and to provide information on how to use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.
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