标准编号：ISO 17470:2014
中文名称：微光束分析 电子探针微量分析 波长色散X射线光谱法进行定性点分析的指南
英文名称：Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
发布日期：2014-01
标准范围
This International Standard gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electronprobe microanalyser or on a scanning electron microscope.
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