ISO 25498:2018 微束分析 分析电子显微镜 采用透射电子显微镜的选择区域电子衍射分析

标准编号：ISO 25498:2018

中文名称：微束分析 分析电子显微镜 采用透射电子显微镜的选择区域电子衍射分析

英文名称：Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope

发布日期：2018-03

标准范围

This document specifies the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens. This document applies to test areas of micrometres and sub-micrometres in size. The minimum diameter of the selected area in a specimen which can be analysed by this method is restricted by the spherical aberration coefficient of the objective lens of the microscope and approaches several hundred nanometres for a modern TEM.
When the size of an analysed specimen area is smaller than that restriction, this document can also be used for the analysis procedure. But, because of the effect of spherical aberration, some of the diffraction information in the pattern can be generated from outside of the area defined by the selected area aperture. In such cases, the use of microdiffraction (nano-beam diffraction) or convergent beam electron diffraction, where available, might be preferred.
This document is applicable to the acquisition of SAED patterns from crystalline specimens, indexing the patterns and calibration of the diffraction constant.

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