标准编号：ISO/IEC 10373-3:2010
中文名称：识别卡 试验方法 第3部分：带有触点和相关集成装置的集成电路卡
英文名称：Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices
发布日期：2010-10
标准范围
This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit cards with contactsand related interface devices according to the definition given in ISO/IEC 7816. Each test method iscross-referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of thesupplementary International Standards that define the information storage technologies employed inidentification card applications.NOTE Criteria for acceptability do not form part of this part of ISO/IEC 10373 but will be found in the InternationalStandards mentioned above.This part of ISO/IEC 10373 defines test methods which are specific to integrated circuit technology withcontacts. ISO/IEC 10373-1 defines test methods which are common to one or more card technologies andother parts define other technology-specific tests.Test methods defined in this part of ISO/IEC 10373 are intended to be performed separately andindependently. A given card is not required to pass through all the tests sequentially. The test methodsdefined in this part of ISO/IEC 10373 are based on ISO/IEC 7816-3.Conformance of cards and IFDs determined using the test methods defined in this part of ISO/IEC 10373does not preclude failures in the field. Reliability testing is outside the scope of this part of ISO/IEC 10373.This part of ISO/IEC 10373 does not define any test to establish the complete functioning of integrated circuitcards. The test methods require only that the minimum functionality be verified. Minimum functionality isdefined as follows.- Any integrated circuit present in the card continues to show an Answer to Reset response whichconforms to the base standard.- Any contacts associated with any integrated circuit present in the card continue to show electricalresistance which conforms to the base standard.
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