标准编号:ISO/TS 10867:2019

中文名称:纳米技术 近红外光致发光谱法表征单壁碳纳米管

英文名称:Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy

发布日期:2019-12

标准范围

This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.
It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities.
The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.

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