ISO 18554:2016 表面化学分析 电子光谱 用X射线光电子能谱法进行材料分析时X射线导致意外降解的识别、评估和纠正程序

标准编号：ISO 18554:2016

中文名称：表面化学分析 电子光谱 用X射线光电子能谱法进行材料分析时X射线导致意外降解的识别、评估和纠正程序

英文名称：Surface chemical analysis — Electron spectroscopies — Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectro

发布日期：2016-03

标准范围

This International Standard provides a simple procedure for identifying, estimating and correcting forunintended degradation in the elemental composition or chemical state of a material which occurs asa result of X-radiation during the time that a specimen material is exposed to the X-rays used in X-rayphotoelectron spectroscopy (XPS).This International Standard does not address comparisons between different types of material nor doesit address the mechanisms, depth, or chemical nature of the degradation that occurs. The correctionprocedure proposed is only valid if the changes are caused by the X-rays and result in less than a 30 %reduction or increase in intensity of a chosen photoelectron peak from the sample material.

标准预览图