标准编号：ISO 19830:2015
中文名称：表面化学分析 电子光谱 X射线光电子能谱峰拟合的最低报告要求
英文名称：Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
发布日期：2015-11
标准范围
The purpose of this International Standard is to define how peak fitting and the results of peak fitting inX-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum orto a set of related spectra, as might be acquired, for example, during a depth profile measurement. ThisInternational Standard provides a list of those parameters which shall be reported if either reproduciblepeak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared.This International Standard does not provide instructions for peak fitting nor the procedures whichshould be adopted.
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