标准编号：ISO 24173:2024
中文名称：微光束分析 用电子背散射衍射进行定向测量的指南
英文名称：Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
发布日期：2024-02
标准范围
This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
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