标准编号：ISO 15932:2013
中文名称：微光束分析 分析电子显微镜 词汇
英文名称：Microbeam analysis — Analytical electron microscopy — Vocabulary
发布日期：2013-12
标准范围
This International Standard defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order.This International Standard is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those termscommon to them.NOTE See also the ISO online browsing platform (OBP):https://www.iso.org/obp/ui/
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